GENERATION-RECOMBINATION NOISE OF HOT CARRIERS IN SEMICONDUCTORS

被引：5
作者：
REGGIANI, L
LUGLI, P
MITIN, V
机构：
[1] UNIV MODENA,CTR INTERUNIV STRUTTURA MAT,I-41100 MODENA,ITALY
[2] ACAD SCI UKSSR,INST SEMICOND,KIEV,UKRAINE,USSR
来源：
SOLID-STATE ELECTRONICS | 1988年 / 31卷 / 3-4期
关键词：
D O I：
10.1016/0038-1101(88)90337-1
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
12
引用
收藏
页码：543 / 546
页数：4
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