IMPURITY AND DEFECT LEVELS IN BERYLLIUM-DOPED GAAS GROWN BY MOLECULAR-BEAM EPITAXY

被引:42
作者
BHATTACHARYA, PK
BUHLMANN, HJ
ILEGEMS, M
STAEHLI, JL
机构
[1] SWISS FED INST TECHNOL,INST MICROELECTR,CH-1015 LAUSANNE,SWITZERLAND
[2] SWISS FED INST TECHNOL,INST APPL PHYS,CH-1015 LAUSANNE,SWITZERLAND
关键词
D O I
10.1063/1.331511
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:6391 / 6398
页数:8
相关论文
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