A multifunction IBM-PC-based testing apparatus is described that has been designed for testing of CMOS digital integrated circuits. The number of simultaneously checked pins does not exceed 26. The apparatus performs function testing according to prearranged test tables by comparing the actual circuit response with that expected for static steady-state parameters. The logic voltages output levels and the current the circuit consumes are monitored. The apparatus is linked with a computer by an RS-232 serial interface by the standard asynchronous exchange protocol with a baud rate 19,200. The duration of a 100-row test does not exceed 1 sec.
