ARRANGEMENT OF 4 PHOTODETECTORS FOR MEASURING THE STATE OF POLARIZATION OF LIGHT

被引：195
作者：
AZZAM, RMA
机构：
来源：
OPTICS LETTERS | 1985年 / 10卷 / 07期
关键词：
D O I：
10.1364/OL.10.000309
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：309 / 311
页数：3
相关论文
共 12 条
[1]   ROTATING-COMPENSATOR-ANALYZER FIXED-ANALYZER ELLIPSOMETER - ANALYSIS AND COMPARISON TO OTHER AUTOMATIC ELLIPSOMETERS [J].
ASPNES, DE ;
HAUGE, PS .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (09) :949-954
[2]  
AZZAM RMA, 1979, OPTIK, V52, P253
[3]   PRINCIPAL ANGLE, PRINCIPAL AZIMUTH, AND PRINCIPAL-ANGLE ELLIPSOMETRY OF FILM-SUBSTRATE SYSTEMS [J].
AZZAM, RMA ;
ZAGHLOUL, ARM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (08) :1058-1065
[4]   DIVISION-OF-AMPLITUDE PHOTOPOLARIMETER (DOAP) FOR THE SIMULTANEOUS MEASUREMENT OF ALL 4 STOKES PARAMETERS OF LIGHT [J].
AZZAM, RMA .
OPTICA ACTA, 1982, 29 (05) :685-689
[5]   CONTOURS OF CONSTANT PRINCIPAL ANGLE AND CONSTANT PRINCIPAL AZIMUTH IN THE COMPLEX EPSILON-PLANE [J].
AZZAM, RMA .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1981, 71 (12) :1523-1528
[6]  
AZZAM RMA, 1977, ELLIPSOMETRY POLARIS, P491
[7]  
BORN M, 1975, PRINCIPLES OPTICS, P554
[8]   DETERMINATION OF THE ELLIPSOMETRIC CHARACTERISTICS OF OPTICAL-SURFACES USING NANOSECOND LASER-PULSES [J].
COLLETT, E .
SURFACE SCIENCE, 1980, 96 (1-3) :156-167
[9]   RECENT DEVELOPMENTS IN INSTRUMENTATION IN ELLIPSOMETRY [J].
HAUGE, PS .
SURFACE SCIENCE, 1980, 96 (1-3) :108-140
[10]   EXPERIMENTAL DETERMINATIONS OF MUELLER SCATTERING MATRICES FOR NONSPHERICAL PARTICLES [J].
PERRY, RJ ;
HUNT, AJ ;
HUFFMAN, DR .
APPLIED OPTICS, 1978, 17 (17) :2700-2710
12