GENETIC ALGORITHMS FOR NONDESTRUCTIVE TESTING IN CRACK IDENTIFICATION

被引：24

作者：

ARKADAN, AA

SAREEN, T

SUBRAMANIAM, S

机构：

[1] Dept. of Electrical and Computer Engineering, Marquette University, Milwaukee

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1994年 / 30卷 / 06期

关键词：

D O I：

10.1109/20.334074

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method to identify the nature of a crack on the surface of a region using nondestructive testing (NDT) and inverse problem methodology is presented. A genetic algorithm (GA) based approach, which involves a global search to avoid local minima, is presented and applied to salve the inverse problem of identifying the position, shape and the orientation of a surface crack. A fine tuning algorithm is combined with the GA to reach the optimum solution.

引用

页码：4320 / 4322

页数：3

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