A NOTE ON THE SHUKLA-SEN DRIFT VELOCITY MODEL FOR HOT CHARGE-CARRIERS IN GE AND SI

被引:1
作者
ROY, DK
机构
[1] Indian Institute of Technology Hauz Khas New Delhi
关键词
D O I
10.1016/0038-1101(93)90230-N
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
[No abstract available]
引用
收藏
页码:1795 / 1796
页数:2
相关论文
共 4 条
[1]   CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD [J].
CAUGHEY, DM ;
THOMAS, RE .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (12) :2192-+
[2]   UNIFIED MODEL FOR DRIFT VELOCITIES OF ELECTRONS AND HOLES IN SEMICONDUCTORS AS A FUNCTION OF TEMPERATURE AND ELECTRIC-FIELD [J].
MOHAMMAD, SN .
SOLID-STATE ELECTRONICS, 1992, 35 (10) :1391-1396
[3]   ANALYTICAL EXPRESSIONS FOR THE DRIFT VELOCITY OF HOT CHARGE-CARRIERS IN SILICON [J].
SHUKLA, SR ;
SEN, MN .
SOLID-STATE ELECTRONICS, 1992, 35 (04) :593-597
[4]  
SZE SM, 1981, PHYSICS SEMICONDUCTO, P44