EPR IDENTIFICATION OF A TRIGONAL FEIN DEFECT IN SILICON

被引：20
作者：
OMLING, P
EMANUELSSON, P
GEHLHOFF, W
GRIMMEISS, HG
机构：
来源：
SOLID STATE COMMUNICATIONS | 1989年 / 70卷 / 08期
关键词：
D O I：
10.1016/0038-1098(89)90503-6
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：807 / 810
页数：4
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