LINE NARROWING IN A H ATOM IN INTENSE LASER FIELDS AT SUBTHRESHOLD AND ABOVE-THRESHOLD FREQUENCIES

被引：13
作者：
DIMOU, L
FAISAL, FHM
机构：
[1] Fakultät für Physik, Universität Bielefeld
来源：
PHYSICS LETTERS A | 1992年 / 171卷 / 3-4期
关键词：
D O I：
10.1016/0375-9601(92)90428-O
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Line widths due to ionization decay of a H atom in intense laser fields are investigated by solving the (3 + 1)-D Schrodinger equation numerically exactly. Quantitative results for line narrowing both at sub-threshold and above-threshold frequencies are given and a mechanism for the appearance of minima in the line widths is discussed.
引用
收藏
页码：211 / 214
页数：4
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