COMPARATIVE STUDIES OF FAST RECOMBINATION PROCESSES IN AMORPHOUS-SILICON FILMS

被引:7
作者
BERGNER, H [1 ]
BRUCKNER, V [1 ]
KERSTAN, F [1 ]
NOWICK, W [1 ]
机构
[1] TH KARL MARX STADT,SEKT PHYS ELEKTRON BAUELEMENTE,DDR-9001 KARL MARX STADT,GER DEM REP
来源
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1983年 / 117卷 / 02期
关键词
D O I
10.1002/pssb.2221170221
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:603 / 610
页数:8
相关论文
共 16 条
[1]   DEFECTS IN AMORPHOUS CHALCOGENIDES AND SILICON [J].
ADLER, D .
JOURNAL DE PHYSIQUE, 1981, 42 (NC4) :3-14
[2]   AMORPHOUS-SILICON PHOTODETECTOR FOR PICOSECOND PULSES [J].
AUSTON, DH ;
LAVALLARD, P ;
SOL, N ;
KAPLAN, D .
APPLIED PHYSICS LETTERS, 1980, 36 (01) :66-68
[3]   SPATIALLY INHOMOGENEOUS CARRIER CONCENTRATION-DEPENDENCE OF THE REFLECTIVITY OF SEMICONDUCTORS [J].
BERGNER, H ;
BRUCKNER, V ;
SCHRODER, B .
OPTICAL AND QUANTUM ELECTRONICS, 1982, 14 (03) :245-251
[4]   PICOSECOND REFLECTIVITY MEASUREMENTS ON GLOW-DISCHARGE A-SI-H [J].
BERGNER, H ;
BRUCKNER, V ;
DIETRICH, D ;
KERSTAN, F ;
NOWICK, W .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1983, 117 (01) :197-202
[5]  
BERGNER H, 1982, EXP TECHNIK PHYSIK, V30, P407
[6]  
BERGNER H, KVANTOVAYA ELEKTRONI
[7]  
Bonch-Bruevich V. L., 1982, HALBLEITERPHYSIK
[8]  
DIETRICH D, 1982, THESIS TH K MARX STA
[9]  
JOHNSON AM, 1980, 2ND DIG C PIC PHEN
[10]  
Mott N. F., 1979, ELECT PROCESSES NONC