HIGH ANGLE AND ENERGY RESOLUTION PHOTOELECTRON-SPECTROSCOPY FOR GAAS WITH NEGATIVE ELECTRON-AFFINITY

被引:0
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KORABLEV, VV
KUDINOV, YA
SUGAIPOV, MS
BARANOVA, TD
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RADIOTEKHNIKA I ELEKTRONIKA | 1992年 / 37卷 / 02期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:321 / 326
页数:6
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[31]   EVIDENCE FOR ELECTRON-EMISSION STIMULATED DESORPTION FROM NEGATIVE ELECTRON-AFFINITY GAAS SURFACES [J].
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