X-RAY-DIFFRACTION STUDY OF MICROSTRUCTURE IN ZNS THIN-FILMS GROWN FROM ZINC ACETATE BY ATOMIC LAYER EPITAXY

被引：24

作者：

OIKKONEN, M ^{[1
]}

BLOMBERG, M ^{[1
]}

TUOMI, T ^{[1
]}

TAMMENMAA, M ^{[1
]}

机构：

[1] HELSINKI UNIV TECHNOL,DEPT CHEM,SF-02150 ESPOO,FINLAND

来源：

THIN SOLID FILMS | 1985年 / 124卷 / 3-4期

关键词：

D O I：

10.1016/0040-6090(85)90282-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：317 / 321

页数：5

共 11 条

[1] PARTICLE-SIZE DISTRIBUTION FUNCTION OF SUPPORTED METAL-CATALYSTS BY X-RAY-DIFFRACTION [J].

GANESAN, P ;

KUO, HK ;

SAAVEDRA, A ;

DEANGELIS, RJ .

JOURNAL OF CATALYSIS, 1978, 52 (02) :310-320

[2]

LAHTINEN JA, 1983, ACTA POLYTECH SCAND, V138, P97

[3] ITERATIVE DECONVOLUTION OF SMEARED DATA FUNCTIONS [J].

MENCIK, Z .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (FEB1) :44-50

[4]

MIGNOT J, 1975, ACTA METALL MATER, V23, P1321, DOI 10.1016/0001-6160(75)90140-6

[5]

Suntola T., 1980, SID 80 DIGEST, V11, P108

[6] ZINC CHALCOGENIDE THIN-FILMS GROWN BY THE ATOMIC LAYER EPITAXY TECHNIQUE USING ZINC ACETATE AS SOURCE MATERIAL [J].

TAMMENMAA, M ;

KOSKINEN, T ;

HILTUNEN, L ;

NIINISTO, L ;

LESKELA, M .

THIN SOLID FILMS, 1985, 124 (02) :125-128

[7] X-RAY-DIFFRACTION STUDY OF THIN ELECTROLUMINESCENT ZNS FILMS GROWN BY ATOMIC LAYER EPITAXY [J].

TANNINEN, VP ;

OIKKONEN, M ;

TUOMI, TO .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1981, 67 (02) :573-583

[8] EXPERIMENTAL SEPARATION OF K-ALPHA-1 AND K-ALPHA-2 COMPONENTS IN X-RAY-LINE PROFILE ANALYSIS [J].

TANNINEN, VP .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 206 (03) :587-591

[9]

TANNINEN VP, 1983, THIN SOLID FILMS, V109, P282

[10] SELECTED ANALYTICAL TOOLS YIELD A BETTER INSIGHT INTO ELECTROLUMINESCENT THIN-FILMS [J].

THEIS, D .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 81 (02) :647-655

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