OBSERVATIONS OF ELECTRON CHANNELING PATTERNS IN AN AUGER-ELECTRON SPECTROMETER WITH SCANNING SAMPLE POSITIONER

被引：2

作者：

SEILER, H ^{[1
]}

KUHNLE, G ^{[1
]}

BAUER, H ^{[1
]}

机构：

[1] UNIV TUBINGEN,INST ANGEWANDTE PHYS,D-7400 TUBINGEN,FED REP GER

来源：

APPLIED PHYSICS | 1975年 / 6卷 / 02期

关键词：

D O I：

10.1007/BF00883746

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：167 / 171

页数：5

共 22 条

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[7] AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES [J].

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APPLIED PHYSICS LETTERS, 1971, 19 (09) :315-+

[8] ELECTRONIC SUPERPOSITION OF SAMPLE CURRENT AND SECONDARY-ELECTRON IMAGES IN AUGER-ELECTRON SPECTROSCOPY [J].

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