TWO-DIMENSIONAL PHASE RETRIEVAL FROM IMAGE AND DIFFRACTION PATTERNS IN ELECTRON-MICROSCOPES

被引：0
|
作者：
SHAO, ZF [1 ]
JIYE, XM [1 ]
机构：
[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637
来源：
OPTIK | 1985年 / 71卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：15 / 22
页数：8
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