TWO-DIMENSIONAL PHASE RETRIEVAL FROM IMAGE AND DIFFRACTION PATTERNS IN ELECTRON-MICROSCOPES

被引：0

|

作者：

SHAO, ZF ^{[1
]}

JIYE, XM ^{[1
]}

机构：

[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

来源：

OPTIK | 1985年 / 71卷 / 01期

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D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

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页码：15 / 22

页数：8

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