QUANTITATIVE-ANALYSIS OF COVERAGE AND ORIENTATION OF ORGANIC FILMS ON SEMICONDUCTOR AND INSULATOR SUBSTRATES USING INFRARED EXTERNAL REFLECTION SPECTROSCOPY

被引：0
|
作者：
ALLARA, DL [1 ]
PORTER, MD [1 ]
机构：
[1] BELL COMMUN RES,MURRAY HILL,NJ 07974
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1987年 / 193卷
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：54 / ANYL
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