SPACE-TIME RESOLVED REFLECTIVITY MEASUREMENTS OF PICOSECOND LASER-PULSE INDUCED PHASE-TRANSITIONS IN (111) SILICON SURFACE-LAYERS

被引：57
作者：
YEN, R
LIU, JM
KURZ, H
BLOEMBERGEN, N
机构：
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1982年 / 27卷 / 03期
关键词：
D O I：
10.1007/BF00616666
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：153 / 160
页数：8
相关论文
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