COMPUTER-AIDED MEASUREMENT OF Q-FACTOR WITH APPLICATION TO QUASI OPTICAL OPEN RESONATORS

被引:0
作者
ARORA, RK
ADITYA, S
XU, XZ
机构
[1] FAMU/FSU College of Engineering, Department of Electrical Engineering, Tallahassee
关键词
Microwave Measurements--Computer Applications - Optical Devices--Measurements - Resonators--Measurements;
D O I
10.1109/19.106314
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A technique for automated measurement of Q-factor based on observation of resonator response at a set of points near resonance is presented. The resonance curve, suitably corrected for noise and presence of unwanted modes, is transformed into a linear graph. Based on this transformation, an analysis of error in the measurement of Q is carried out. An example of measurement on an open resonator at 97 GHz, with an accuracy of about 1% in the evaluation of Q, is included.
引用
收藏
页码:863 / 866
页数:4
相关论文
共 12 条
[1]   AN AUTOMATED 60 GHZ OPEN RESONATOR SYSTEM FOR PRECISION DIELECTRIC MEASUREMENT [J].
AFSAR, MN ;
LI, XH ;
CHI, H .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (12) :1845-1853
[3]  
Cullen A. L., 1970, Proceedings of the Royal Society of London, Series A (Mathematical and Physical Sciences), V315, P217, DOI 10.1098/rspa.1970.0038
[4]   ACCURATE MEASUREMENT OF PERMITTIVITY BY MEANS OF AN OPEN RESONATOR [J].
CULLEN, AL ;
YU, PK .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1971, 325 (1563) :493-&
[5]  
Ginzton EL., 1957, MICROWAVE MEASUREMEN
[6]   DETAILED MEASUREMENT OF SCATTERING BY A SPHEROIDAL PARTICLE HAVING VARYING PROPORTIONS OF ICE AND WATER [J].
HUME, AL ;
AUCHTERLONIE, LJ .
IEE PROCEEDINGS-H MICROWAVES ANTENNAS AND PROPAGATION, 1989, 136 (04) :351-357
[7]   PRECISE DIELECTRIC MEASUREMENTS AT 35 GHZ USING AN OPEN MICROWAVE RESONATOR [J].
JONES, RG .
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1976, 123 (04) :285-290
[8]   LASER BEAMS AND RESONATORS [J].
KOGELNIK, H ;
LI, T .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (10) :1312-+
[9]  
MENDENHALL W, 1981, MATH STATISTICS APPL
[10]  
SUCHER M, 1963, HDB MICROWAVE MEASUR, V3