FABRICATION AND CHARACTERIZATION OF NB (NB NANOCONSTRICTIONS) NBN SHORT WEAK LINKS

被引：7
作者：
ABE, H
HAMASAKI, K
KOJIMA, K
SASAKI, M
机构：
[1] Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1994年 / 33卷 / 6A期
关键词：
THIN-FILM SHORT WEAK LINK; SNS' POINT CONTACT; ANDREEV REFLECTION; EXCESS CURRENT; BTK THEORY; 2-LEVEL FLUCTUATION;
D O I：
10.1143/JJAP.33.3435
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report the fabrication and characterization of thin-film Nb-(Nb nanoconstrictions)-NbN short weak links prepared by applying an electric field to an insulating Nb/MgO/NbN edge sandwich with an area of 0.2 mu m(2). The growth of Nb nanoconstrictions in the MgO (similar to-7 nm thick) insulator layer connecting two superconducting banks is assisted by electric field in liquid helium. For an interpretation of device quasiparticle characteristics, the Blender, Tinkham and Klapwijk (BTK) theory [Phys. Rev. B 25 (1982) 4515] is used. The current-voltage curves and excess current-normal resistance products are found to agree closely with the BTK predictions by assuming two independent (series) normal metal-superconductor contacts. The two-level fluctuation (TLF) of conductance was apparently observed in the samples with Andreev reflection probability of A(E)<<1. For the samples with A(E)similar to 1, i.e., nearly clean contacts, no apparent TLF was observed in the frequency band up to 100 kHz.
引用
收藏
页码：3435 / 3442
页数：8
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