SEMICONDUCTOR ANALYSIS USING ORGANIC-ON-INORGANIC CONTACT BARRIERS .2. APPLICATION TO INP-BASED COMPOUND SEMICONDUCTORS

被引：55
作者：
FORREST, SR [1 ]
KAPLAN, ML [1 ]
SCHMIDT, PH [1 ]
机构：
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
来源：
JOURNAL OF APPLIED PHYSICS | 1986年 / 60卷 / 07期
关键词：
D O I：
10.1063/1.337153
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：2406 / 2418
页数：13
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