WRITE CURRENT DEPENDENCE OF TRANSITION NOISE IN THIN-FILM MEDIA

被引：9
作者：
LEE, SY
PRESSESKY, JL
WILLIAMS, D
HEIMAN, N
机构：
[1] Seagate Magnetics, Fremont
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1990年 / 26卷 / 01期
关键词：
D O I：
10.1109/20.50509
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Complex behavior of the noise in thin film recording media is observed with regard to its dependency on bulk magnetic parameters, recording density, write current, and alloy composition. The pattern of this complex behavior is the result of the writing process and thus reflects only the bulk magnetic properties of the medium; whereas the amplitude of the noise voltage is seen to be associated with the nature of the magnetic alloy films. © 1990 IEEE
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收藏
页码：121 / 123
页数：3
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