ENHANCEMENT OF ORIENTATED GRAIN GROWTH AND PHOTO RESPONSE OF ZnO THIN FILM BY SILAR

被引:0
作者
Thomas, D. [1 ,2 ]
Vattappalam, S. C. [2 ]
Mathew, S. [2 ]
Augustine, S. [2 ]
机构
[1] Bharathiar Univ, Ctr Res & Dev, Coimbatore 641046, Tamil Nadu, India
[2] St Thomas Coll, Postgrad & Res Dept Phys, Palai 686574, Kerala, India
来源
JOURNAL OF OPTOELECTRONIC AND BIOMEDICAL MATERIALS | 2014年 / 6卷 / 03期
关键词
ZnO thin film; SILAR method; Oriented grain growth; Annealing; Al; -doping;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
ZnO thin films were prepared by Successive Ionic Layer Adsorption Reaction (SILAR) method. The variations in the oriented grain growth in the thin films annealed in oxygen, air, argon, nitrogen atmospheres and samples doped with aluminium annealed in air were studied. Oriented grain growth of the samples was measured by comparing the peak intensities of the XRD pattern. Oriented grain growth increases in the order of samples annealed in atmospheres of oxygen, air, argon, nitrogen and aluminium doped. From the SEM micrographs it is found that as the oriented grain growth increases the needle like structure disappears and flowered structure becomes prominent. When the oriented grain growth increases, crystallinity of the thin film improves, photo current and dark curret increases resistance and band gap decreases. ZnO thin films having good (002) orientation is a prerequisite for the fabrication of devices like UV diode lasers, acoustic optic devices etc. The results also indicate that the ZnO is beneficial to solar cells and photodynamic therapy technology. From energy dispersive X-ray analysis, it is inferred that oxygen vacancy creation is responsible for the enhanced oriented grain growth in ZnO thin films when samples are annealed in atmospheres of argon, nitrogen and aluminium doped.
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页码:75 / 83
页数:9
相关论文
共 24 条
[1]   Spectral properties of aluminium doped zinc oxide thin films prepared by SILAR method [J].
Chandramohan, R. ;
Dhanasekaran, V. ;
Ezhilvizhian, S. ;
Vijayan, T. A. ;
Thirumalai, J. ;
Peter, A. John ;
Mahalingam, T. .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2012, 23 (02) :390-397
[2]   Effects of Growth Temperature on the Properties of ZnO Thin Films Grown by Radio-frequency Magnetron Sputtering [J].
Cho, Shinho .
TRANSACTIONS ON ELECTRICAL AND ELECTRONIC MATERIALS, 2009, 10 (06) :185-188
[3]   Structural and optical properties of Mg-doped ZnO thin films prepared by a modified Pechini method [J].
Fang, Dongyu ;
Li, Chaoling ;
Wang, Nan ;
Li, Pei ;
Yao, Pei .
CRYSTAL RESEARCH AND TECHNOLOGY, 2013, 48 (05) :265-272
[4]   CONDUCTIVITY AND HALL EFFECT OF ZNO AT LOW TEMPERATURES [J].
HARRISON, SE .
PHYSICAL REVIEW, 1954, 93 (01) :52-62
[5]   Room-temperature ultraviolet nanowire nanolasers [J].
Huang, MH ;
Mao, S ;
Feick, H ;
Yan, HQ ;
Wu, YY ;
Kind, H ;
Weber, E ;
Russo, R ;
Yang, PD .
SCIENCE, 2001, 292 (5523) :1897-1899
[6]   Structural and nanomechanical properties of a-plane ZnO thin films deposited under different oxygen partial pressures [J].
Jian, Sheng-Rui ;
Chen, Hou-Guang ;
Chen, Guo-Ju ;
Jang, Jason S. C. ;
Juang, Jenh-Yih .
CURRENT APPLIED PHYSICS, 2012, 12 (03) :849-853
[7]   Hybrid Zinc Oxide Nanoparticles for Biophotonics [J].
John, Sween ;
Marpu, Sreekar ;
Li, Jianyou ;
Omary, Mohammad ;
Hu, Zhibing ;
Fujita, Yasuhisha ;
Neogi, Arup .
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2010, 10 (03) :1707-1712
[8]   Preparation of ZnO thin films on sapphire substrates by sol-gel method [J].
Kokubun, Y ;
Kimura, H ;
Nakagomi, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2003, 42 (8A) :L904-L906
[9]   Deposition of ZnO thin films by the ultrasonic spray pyrolysis technique [J].
Lee, Y ;
Kim, H ;
Roh, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (4A) :2423-2428
[10]   Effects of the oxygen partial pressure and annealing atmospheres on the microstructures and optical properties of Cu-doped ZnO films [J].
Li, F. M. ;
Bo, L. T. ;
Ma, S. Y. ;
Huang, X. L. ;
Ma, L. G. ;
Liu, J. ;
Zhang, X. L. ;
Yang, F. C. ;
Zhao, Q. .
SUPERLATTICES AND MICROSTRUCTURES, 2012, 51 (03) :332-342