DIELECTRIC-BREAKDOWN STUDY OF THIN LA2O3 FILMS

被引：13

作者：

SINGH, A

机构：

来源：

关键词：

D O I：

10.1016/0040-6090(83)90205-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：163 / 168

页数：6

共 34 条

[21]

MERRILL RC, 1963, APR SPRING M EL SOC

[22] ELECTRONS IN DISORDERED STRUCTURES [J].

MOTT, NF .

[23]

ODWYER JJ, 1973, THEORY ELECTRICAL CO

[24]

ODWYER JJ, 1964, THEORY DIELECTRIC BR

[25] THE ELECTRIC STRENGTH OF DIELECTRIC FILMS [J].

PLESSNER, KW .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 60 (339) :243-+

[26] ANODIC OXIDATION OF YTTRIUM THIN FILMS [J].

RAIRDEN, JR .

[27] ON THE THICKNESS EFFECT OF DIELECTRIC BREAKDOWN OF MICA AND KCL [J].

RYU, I ;

KAWAMURA, H .

[28]

Samsonov G.V., 1973, OXIDE HDB

[29] ON THE THEORY OF ELECTRON MULTIPLICATION IN CRYSTALS [J].

SEITZ, F .

PHYSICAL REVIEW, 1949, 76 (09) :1376-1393

[30] AC ELECTRICAL BREAKDOWN IN THIN MAGNESIUM-OXIDE FILMS [J].

SINGH, A ;

PRATAP, R .