PLASMA ENHANCED CHEMICAL VAPOR-DEPOSITION MODELING

被引:16
作者
HYMAN, E
TSANG, K
LOTTATI, I
DROBOT, A
LANE, B
POST, R
SAWIN, H
机构
[1] APPL SCI & TECHNOL,WOBURN,MA 01801
[2] MIT,CTR PLASMA FUS,CAMBRIDGE,MA 02139
[3] MIT,DEPT CHEM & ELECT ENGN,CAMBRIDGE,MA 02139
关键词
D O I
10.1016/0257-8972(91)90088-E
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We are developing a model to simulate the plasma enhanced chemical vapor deposition (PECVD) of thin diamond films. The emphasis to date has been on the development of stand-alone modules to simulate the microwave-induced time-dependent electric and magnetic fields, the generation and energization of plasma electrons in the discharge, the non-equilibrium hydrocarbon chemistry, and the development of a two-dimensional unstructured mesh hydrodynamics solver capable of simulating flow through geometrically realistic reactors. The coupling of the various modules, and the incorporation of a surface chemistry module for the substrate deposition, into a self consistent reactor model is underway. We present some preliminary results from components of a model 2.45 GHz microwave reactor employing H-2 with 1% CH4 and operating at a gas pressure of 5.3 x 10(3) Pa (40 Torr). We have completed an electromagnetic model of the microwave energy deposition in the plasma and calculated the field patterns in the reactor. We have also performed point calculations of the time-dependent electron distribution and of the build-up of atomic hydrogen, the gas temperature, and the resulting generation of CH3, C2H2, and other hydrocarbon radicals. We have also completed a fluid simulation of the flow through the reactor using unstructured mesh techniques. The results we discuss in this paper indicate that careful treatment of non-equilibrium processes in PECVD reactors as well as accurate representation of reactor geometry are essential to a useful simulation capability.
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页码:387 / 393
页数:7
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