AN X-RAY-SCATTERING STUDY OF VITREOUS KFESI3O8 AND NAFESI3O8 AND REINVESTIGATION OF VITREOUS SIO2 USING QUASI-CRYSTALLINE MODELING

被引：42

作者：

HENDERSON, GS ^{[1
]}

FLEET, ME ^{[1
]}

BANCROFT, GM ^{[1
]}

机构：

[1] UNIV WESTERN ONTARIO, DEPT CHEM, LONDON N6A 5B7, ONTARIO, CANADA

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1984年 / 68卷 / 2-3期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/0022-3093(84)90015-2

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：333 / 349

页数：17

共 50 条

[1]

[Anonymous], 1974, INT TABLES XRAY CRYS, VIV

[2] ANALYTIC APPROXIMATIONS TO INCOHERENTLY SCATTERED X-RAY INTENSITIES [J].

BALYUZI, HHM .

ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 (SEP1) :600-602

[3] STUDY OF THE STRUCTURE OF SILICA GLASS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

BANDO, Y ;

ISHIZUKA, K .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 33 (03) :375-382

[4]

BUEGER MJ, 1954, AM MINERAL, V39, P600

[5] EFFECT OF THERMAL MOTION ON ESTIMATION OF BOND LENGTHS FROM DIFFRACTION MEASUREMENTS [J].

BUSING, WR ;

LEVY, HA .

ACTA CRYSTALLOGRAPHICA, 1964, 17 (02) :142-&

[6] AN X-RAY DIFFRACTION STUDY OF STRUCTURE OF SILICA GLASS [J].

CARTZ, L .

ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1964, 120 (4-5) :241-&

[7]

CLARK JR, 1969, MINERAL SOC AM SPEC, V0002

[8] CALCULATION OF ABSORPTION CORRECTIONS FOR CAMERA AND DIFFRACTOMETER DATA [J].

COPPENS, P ;

LEISEROWITZ, L ;

RABINOVICH, D .

ACTA CRYSTALLOGRAPHICA, 1965, 18 :1035-+

[9] REFINEMENT OF STRUCTURE OF VITREOUS SILICA [J].

SILVA, JRGD ;

PINATTI, DG ;

ANDERSON, CE ;

RUDEE, ML .

PHILOSOPHICAL MAGAZINE, 1975, 31 (03) :713-717

[10] ABSORPTION CORRECTION IN CRYSTAL STRUCTURE ANALYSIS [J].

DEMEULENAER, J ;

TOMPA, H .

ACTA CRYSTALLOGRAPHICA, 1965, 19 :1014-+

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