HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY ON CRYSTAL-STRUCTURES OF HIGH-TC SUPERCONDUCTORS

被引：16

|

作者：

HIRAGA, K

OKU, T

SHINDO, D

HIRABAYASHI, M

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1989年 / 12卷 / 03期

关键词：

D O I：

10.1002/jemt.1060120306

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

收藏

页码：228 / 243

页数：16

相关论文

共 50 条

[31] TEMPERATURE STABILIZED SAMPLE STAGE FOR THE INVESTIGATION OF HIGH-TC SUPERCONDUCTORS BY SCANNING ELECTRON-MICROSCOPY
GROSS, R
BOSCH, J
WENER, HG
FISCHER, J
HUEBENER, RP
CRYOGENICS, 1989, 29 (07) : 716 - 719
[32] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF MODULATED STRUCTURE IN BI-SR-CA-CU-O HIGH-TC SUPERCONDUCTOR
MATSUI, Y
MAEDA, H
TANAKA, Y
HORIUCHI, S
IBE, K
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 231 - 232
[33] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DUMORTIERITE
VANDYCK, D
TAMBUYSER, P
VANLANDUYT, J
AMELINCKX, S
AMERICAN MINERALOGIST, 1976, 61 (9-10) : 1016 - 1019
[34] HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPY
CARPENTER, RW
ULTRAMICROSCOPY, 1982, 8 (1-2) : 79 - 93
[35] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF A ZEOLITE
NILSSON, AE
THOMASSON, R
ULTRAMICROSCOPY, 1988, 24 (01) : 73 - 73
[36] THE FUTURE OF HIGH-RESOLUTION ELECTRON-MICROSCOPY
COWLEY, JM
ULTRAMICROSCOPY, 1985, 18 (1-4) : 463 - 468
[37] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AMORPHOUS STRUCTURES - POSSIBILITIES AND LIMITATIONS
CHEVALIER, JP
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1985, 10 (03): : 149 - 157
[38] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF POLYMERS
THOMAS, EL
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1985, 190 (SEP): : 83 - POY
[39] KODIREX FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY
DORIGNAC, D
MACLACHLAN, MEC
JOUFFREY, B
ULTRAMICROSCOPY, 1976, 2 (01) : 49 - 52
[40] HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPY
CARPENTER, RW
PHYSICS TODAY, 1981, 34 (03) : 34 - &

← 1 2 3 4 5 →