Optimum log-logistic step-stress model with censoring

Purpose - To obtain an optimal simple time-step stress accelerated life test for the case involving pre-specified censoring time. Such a test saves time and expenses over tests at normal conditions. Design/methodology/approach - Most of the available literature on step-stress accelerated life testing deals with the exponential and weibull distribution. The log-logistic life distribution has been found appropriate for high reliability components. Findings - The method developed has been illustrated using the data simulated from cumulative exposure log-logistic step-stress model with censoring time specified. Originality/value - The model suggested is appropriate in the field of high reliability components such as insulation system.