A RELIABLE APPROACH TO CHARGE-PUMPING MEASUREMENTS IN MOS-TRANSISTORS

被引：1073
作者：
GROESENEKEN, G
MAES, HE
BELTRAN, N
DEKEERSMAECKER, RF
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1984年 / 31卷 / 01期
关键词：
D O I：
10.1109/T-ED.1984.21472
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：42 / 53
页数：12
相关论文
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