CONSIDERATION OF ACCURACY IN THE ANALYSIS OF ULTRA PURE ALUMINUM

被引:9
作者
GENNA, JL
机构
[1] Alcoa, Alcoa Center, PA, USA, Alcoa, Alcoa Center, PA, USA
关键词
CRYSTALLIZATION - GLOW DISCHARGES - MASS SPECTROMETERS;
D O I
10.1016/0022-0248(88)90072-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The elemental analysis of ultra high purity aluminum is discussed with specific emphasis on the use of several instrumental techniques, including glow discharge mass spectroscopy. The difficulty inherent in producing a standard reference material at purity levels in excess of 99. 999% is also examined. Finally a study to determine the extent to which the manufacturing process contributes to the overall variability of product quality is presented.
引用
收藏
页码:62 / 67
页数:6
相关论文
共 9 条
[1]  
BUSHAW BA, 1983, 26TH P OAK RIDG C AN
[2]   A PLASMA DISCHARGE SOURCE-MASS SPECTROMETER FOR INORGANIC ANALYSIS [J].
CANTLE, JE ;
HALL, EF ;
SHAW, CJ ;
TURNER, PJ .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN) :11-13
[3]   DETERMINATION OF URANIUM AND THORIUM IN SEMICONDUCTOR MEMORY MATERIALS BY HIGH FLUENCE NEUTRON-ACTIVATION ANALYSIS [J].
DYER, FF ;
EMERY, JF ;
NORTHCUTT, KJ ;
SCOTT, RM .
JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1982, 72 (1-2) :53-67
[4]  
HARADA Y, 1986, BUNSEKI KAGAKU, V35, P641
[5]   GLOW-DISCHARGE MASS-SPECTROMETRY [J].
HARRISON, WW ;
HESS, KR ;
MARCUS, RK ;
KING, FL .
ANALYTICAL CHEMISTRY, 1986, 58 (02) :A341-&
[6]   ANALYTICAL-CHEMISTRY OF SURFACES .3. ION SPECTROSCOPY [J].
HERCULES, DM ;
HERCULES, SH .
JOURNAL OF CHEMICAL EDUCATION, 1984, 61 (07) :592-599
[7]  
KAWASHIMA T, 1984, 26TH P S SEM INT CIR, P86
[8]  
KUDERMANN G, 1985, MIKROCHIM ACTA, V2, P85
[9]   DETECTION OF ULTRATRACE LEVELS OF URANIUM IN AQUEOUS SAMPLES BY LASER-INDUCED FLUORESCENCE SPECTROMETRY [J].
PERRY, DL ;
KLAINER, SM ;
BOWMAN, HR ;
MILANOVICH, FP ;
HIRSCHFELD, T ;
MILLER, S .
ANALYTICAL CHEMISTRY, 1981, 53 (07) :1048-1050