MODELING ION-BOMBARDMENT INDUCED SUBMICRON-SCALE SURFACE ROUGHENING

被引:9
作者
KOPONEN, I
HAUTALA, M
机构
[1] Department of Physics, University of Helsinki, SF-00014
关键词
D O I
10.1016/0168-583X(95)00833-0
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Ion bombardment induced surface roughening in submicron-scale is modelled. The effect of ion beam on the evolution of the surface is described as a Levy stable shot noise. Height fluctuations are assumed to be smoothed out only by surface tension or diffusion, which is driven by height gradient. The resulting noise driven diffusion equation leads to the development of self-affine surfaces, where the roughness exponent ct depends on the distribution of noise amplitude. High values of alpha approximate to 0.5 recently observed in experiments are shown to result from a shot noise proportional to the typical recoil displacements in cascades created by low energy, heavy ion bombardment.
引用
收藏
页码:156 / 160
页数:5
相关论文
共 12 条
[1]   NUMERICAL-SOLUTION OF A CONTINUUM EQUATION FOR INTERFACE GROWTH IN 2+1 DIMENSIONS [J].
AMAR, JG ;
FAMILY, F .
PHYSICAL REVIEW A, 1990, 41 (06) :3399-3402
[2]   UNIVERSALITY IN SURFACE GROWTH - SCALING FUNCTIONS AND AMPLITUDE RATIOS [J].
AMAR, JG ;
FAMILY, F .
PHYSICAL REVIEW A, 1992, 45 (08) :5378-5393
[3]   THE SURFACE STATISTICS OF A GRANULAR AGGREGATE [J].
EDWARDS, SF ;
WILKINSON, DR .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1982, 381 (1780) :17-31
[4]   SUBMICRON-SCALE SURFACE ROUGHENING INDUCED BY ION-BOMBARDMENT [J].
EKLUND, EA ;
BRUINSMA, R ;
RUDNICK, J ;
WILLIAMS, RS .
PHYSICAL REVIEW LETTERS, 1991, 67 (13) :1759-1762
[5]  
Feller W., 1966, INTRO PROBABILITY TH, V2
[6]   A NOTE ON LOW-ENERGY RECOILS IN COLLISIONAL MIXING [J].
HAUTALA, M ;
KOPONEN, I ;
KAUKONEN, HP .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 66 (04) :508-510
[7]  
KARDAR M, 1991, PHYS REV LETT, V67, P889
[8]   CALCULATION OF COLLISIONAL MIXING [J].
KOPONEN, I ;
HAUTALA, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 47 (04) :375-392
[9]   SCANNING TUNNELING MICROSCOPY OBSERVATION OF SELF-AFFINE FRACTAL ROUGHNESS IN ION-BOMBARDED FILM SURFACES [J].
KRIM, J ;
HEYVAERT, I ;
VANHAESENDONCK, C ;
BRUYNSERAEDE, Y .
PHYSICAL REVIEW LETTERS, 1993, 70 (01) :57-60
[10]   EXACT SCALING IN SURFACE GROWTH WITH POWER-LAW NOISE [J].
LAM, CH ;
SANDER, LM .
PHYSICAL REVIEW E, 1993, 48 (02) :979-987