USE OF A FAST ATOM BEAM IN ION MICROSCOPY (FABIM) FOR ANALYSIS OF POORLY CONDUCTING MATERIALS

被引：17
作者：
DEGREVE, F
LANG, JM
机构：
来源：
SURFACE AND INTERFACE ANALYSIS | 1985年 / 7卷 / 04期
关键词：
D O I：
10.1002/sia.740070405
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：177 / 187
页数：11
相关论文
共 12 条
[1]  
BARBER M, 1981, J CHEM SOC CHEM COMM, P345
[2]  
BERNHEIM M, 1973, THESIS U PARIS SUD C
[3]   ANALYSIS OF POLYMER SURFACES BY SIMS .1. AN INVESTIGATION OF PRACTICAL PROBLEMS [J].
BRIGGS, D ;
WOOTTON, AB .
SURFACE AND INTERFACE ANALYSIS, 1982, 4 (03) :109-115
[4]   ANALYSIS OF POLYMER SURFACES BY SIMS .3. PRELIMINARY-RESULTS FROM MOLECULAR IMAGING AND MICROANALYSIS EXPERIMENTS [J].
BRIGGS, D .
SURFACE AND INTERFACE ANALYSIS, 1983, 5 (03) :113-118
[5]  
BROCHARDT G, 1981, MIKROCHIM ACTA, V2, P421
[6]   STATIC SIMS FOR APPLIED SURFACE-ANALYSIS [J].
BROWN, A ;
VICKERMAN, JC .
SURFACE AND INTERFACE ANALYSIS, 1984, 6 (01) :1-14
[7]  
CHAINTREAU M, UNPUB J MICROSC SPEC
[8]  
DEVIENNE FM, 1973, CRAS PARIS, P276
[9]  
GOURGOUT JM, 1979, SIMS, V2, P286
[10]   SUPPRESSION OF MOLECULAR-IONS IN THE SECONDARY ION MASS-SPECTRA OF MINERALS [J].
METSON, JB ;
BANCROFT, GM ;
MCINTYRE, NS ;
CHAUVIN, WJ .
SURFACE AND INTERFACE ANALYSIS, 1983, 5 (05) :181-185
12