IMAGE QUALITY IMPROVEMENT OF HIGH-RESOLUTION ELECTRON-MICROGRAPHS WITH ASTIGMATISM AND COMA ABERRATIONS BY OPTICAL MEANS

被引：0

作者：

SHEN, XQ

ZHENG, SH

LI, FH

BOSECK, S

机构：

来源：

OPTIK | 1988年 / 79卷 / 04期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：171 / 176

页数：6

共 13 条

[1] COMPLEX SPATIAL FILTERING WITH BINARY MASKS [J].

BROWN, BR ;

LOHMANN, AW .

APPLIED OPTICS, 1966, 5 (06) :967-&

[2]

BURGE RE, 1976, OPTIK, V44, P159

[3]

BURGE RE, 1975, OPTIK, V43, P53

[4]

HERRMANN KH, 1978, P INT C ELECTR MICR, V1, P226

[5] BINARY FRAUNHOFER HOLOGRAMS GENERATED BY COMPUTER [J].

LOHMANN, AW ;

PARIS, DP .

APPLIED OPTICS, 1967, 6 (10) :1739-&

[6]

MOUNTAIN GD, 1982, OPTIK, V61, P335

[7]

MOUNTAIN GD, 1982, OPTIK, V61, P263

[8]

REUBER E, 1987, 6TH P PFEFF C NIAG F

[9]

SHEN X, 1984, OPTIK, V68, P137

[10]

SHEN X, 1984, OPTIK, V68, P17