REFRACTOMETRY BY MINIMUM DEVIATION - ACCURACY ANALYSIS

被引：52

作者：

TENTORI, D

LERMA, JR

机构：

来源：

关键词：

D O I：

10.1117/12.55573

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We analyze the accuracy achieved when evaluating high refractive indices by minimum deviation deflectometry.

引用

页码：160 / 168

页数：9

共 11 条

[1]

FISHER GE, 1967, APPL OPTICAL ENG 1, V4, pCH10

[2]

LEVI L, 1968, APPL OPTICS, V1, P354

[3]

MICHELS WC, 1968, FDN OPTICS, P835

[4]

SMITH WJ, 1966, MODERN OPTICAL ENG, P40

[5]

STRONG J, 1958, CONCEPTS CLASSICAL O, P303

[6]

WAGNER AF, 1945, EXPT OPTICS, P18

[7] METHODS IN HIGH PRECISION REFRACTOMETRY OF OPTICAL GLASSES [J].

WERNER, AJ .

APPLIED OPTICS, 1968, 7 (05) :837-&

[8]

YOUNG HD, 1962, STATISTICAL TREATMEN, P191

[9]

1989, WILD PRECISION SPECT

[10]

1987, EALING PRODUCT GUIDE, P198