SCANNING ELECTRON ACOUSTIC MICROSCOPY OF SIC PARTICLES IN METAL MATRIX COMPOSITES

被引：3

作者：

CANTRELL, JH ^{[1
]}

QIAN, ML ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1989年 / 122卷 / 01期

关键词：

D O I：

10.1016/0921-5093(89)90770-3

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：47 / 52

页数：6

共 10 条

[1] THERMAL-WAVE MICROSCOPY WITH ELECTRON-BEAMS [J].

BRANDIS, E ;

ROSENCWAIG, A .

[2] ULTRASONIC-IMAGING IN SCANNING ELECTRON-MICROSCOPY [J].

CARGILL, GS .

[3]

DAVIES DG, 1983, I PHYS C SER, V68, P467

[4]

Favro L. D., 1987, Photoacoustic and thermal wave phenomena in semiconductors, P69

[5]

HOLSTEIN WL, 1984, SCAN ELECTRON MICROS, P1033

[6] IMAGE-FORMATION IN ELECTRON THERMOELASTIC ACOUSTIC MICROSCOPY [J].

HOLSTEIN, WL .

[7] SIGNAL GENERATION IN SCANNING ELECTRON ACOUSTIC MICROSCOPY [J].

QIAN, M ;

CANTRELL, JH .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 122 (01) :57-64

[8]

QIAN M, 1989, 1989 P I AC OXF 5, V11, P453

[9]

RINDGERMACHER HI, 1986, REV PROGR QUANTITA A, V5, P567

[10] THERMAL-WAVE IMAGING [J].

ROSENCWAIG, A .