LOW-NOISE, HIGH-VOLTAGE SECONDARY-EMISSION ION DETECTOR FOR POLYATOMIC IONS

被引：87

作者：

BEUHLER, RJ ^{[1
]}

FRIEDMAN, L ^{[1
]}

机构：

[1] BROOKHAVEN NATL LAB, DEPT CHEM, UPTON, NY 11973 USA

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY | 1977年 / 23卷 / 02期

关键词：

D O I：

10.1016/0020-7381(77)80091-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：81 / 97

页数：17

共 19 条

[1]

BEUHLER RJ, TO BE PUBLISHED

[2]

CARTER G, 1968, ION BOMBARDMENT SOLI, pCH3

[3] USE OF D-D REACTION TO INVESTIGATE PENETRATION OF 20 KEV DEUTERONS IN GOLD AND ALUMINUM [J].

CHU, YY ;

FRIEDMAN, L .

NUCLEAR INSTRUMENTS & METHODS, 1965, 38 (DEC) :254-&

[4] SCINTILLATION TYPE MASS SPECTROMETER ION DETECTOR [J].

DALY, NR .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1960, 31 (03) :264-267

[5] MEASUREMENT OF STATISTICS OF SECONDARY ELECTRON EMISSION [J].

DELANEY, CFG ;

WALTON, PW .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1966, NS13 (01) :742-+

[6] SECONDARY-ELECTRON EMISSION INDUCED BY 5-30-KEV MONATOMIC IONS STRIKING THIN OXIDE-FILMS [J].

DIETZ, LA ;

SHEFFIELD, JC .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) :4361-4370

[7] SPECTROMETER FOR MEASURING SECONDARY-ELECTRON YIELDS INDUCED BY ION IMPACTS ON THIN-FILM OXIDE SURFACES [J].

DIETZ, LA ;

SHEFFIELD, JC .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (02) :183-191

[8]

DOLE M, 1973, ADV CHEM SER, P73

[9] MOLECULAR BEAMS OF MACROIONS [J].

DOLE, M ;

MACK, LL ;

HINES, RL .

JOURNAL OF CHEMICAL PHYSICS, 1968, 49 (05) :2240-&

[10] MASS SPECTRUM OF A COMPOUND OF FORMULA C72H24O8F128N4P4 AND MOLECULAR WEIGHT 3628 [J].

FALES, HM .

ANALYTICAL CHEMISTRY, 1966, 38 (08) :1058-&

← 1 2 →