CONTACT OVERLAP IN MIM STRUCTURES WITH DISTRIBUTED TRAPS

被引:1
作者
MUHAMMAD, AJ
MORGAN, DV
GUILE, AE
机构
[1] Univ of Leeds, Dep of Electrical, & Electronic Engineering, Leeds,, Engl, Univ of Leeds, Dep of Electrical & Electronic Engineering, Leeds, Engl
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 87卷 / 01期
关键词
D O I
10.1002/pssa.2210870138
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Contact overlap depends on the trap density per unit energy. Conductivity depends on the insulator thickness over a certain range which is determined by a characteristic length. The variation of conductivity with thickness can be stronger than that of a structure with a shallow discrete trap level.
引用
收藏
页码:355 / 362
页数:8
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