CHEMICAL-PROCESSING WITH LASERS - RECENT DEVELOPMENTS

[1] Bauerle D., 1983, Laser Diagnostics and Photochemical Processing for Semiconductor Devices. Proceedings of a Symposium, P19

[2] BAUERLE D, 1985, LASER OPTOELECTRONIK, V1, P29

[3] Bauerle D., 1984, SPRINGER SER CHEM PH, V39, P166

[4] BAUERLE D, 1986, SPRINGER SER MATER S, V1

[5] BAUERLE D, 1984, SPRINGER SER CHEM PH, V39

[6] DOPPELBAUER J, 1987, NATO ASI SER, P277

[7] EXCIMER-LASER-INDUCED ETCHING OF CERAMIC PBTI1-XZRXO3 [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (04) : 1511 - 1514

[8] Eyett M., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V801, P156

[9] INFLUENCE OF THE BEAM SPOT SIZE ON ABLATION RATES IN PULSED-LASER PROCESSING [J]. APPLIED PHYSICS LETTERS, 1987, 51 (24) : 2054 - 2055

[10] EYETT M, 1988, IN PRESS FERROELECTR

[1] Bauerle D., 1983, Laser Diagnostics and Photochemical Processing for Semiconductor Devices. Proceedings of a Symposium, P19

[2] BAUERLE D, 1985, LASER OPTOELECTRONIK, V1, P29

[3] Bauerle D., 1984, SPRINGER SER CHEM PH, V39, P166

[4] BAUERLE D, 1986, SPRINGER SER MATER S, V1

[5] BAUERLE D, 1984, SPRINGER SER CHEM PH, V39

[6] DOPPELBAUER J, 1987, NATO ASI SER, P277

[7] EXCIMER-LASER-INDUCED ETCHING OF CERAMIC PBTI1-XZRXO3 [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (04) : 1511 - 1514

[8] Eyett M., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V801, P156

[9] INFLUENCE OF THE BEAM SPOT SIZE ON ABLATION RATES IN PULSED-LASER PROCESSING [J]. APPLIED PHYSICS LETTERS, 1987, 51 (24) : 2054 - 2055

[10] EYETT M, 1988, IN PRESS FERROELECTR