EFFECT OF TEMPERATURE ON THE VARIANCE OF THE LOG-NORMAL DISTRIBUTION OF FAILURE TIMES DUE TO ELECTROMIGRATION DAMAGE

被引：11

作者：

SCHWARZ, JA

机构：

来源：

关键词：

D O I：

10.1063/1.338954

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：801 / 803

页数：3

共 9 条

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PASCO, RW ;

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[6]

SCHOEN JM, 1980, J APPL PHYS, V51, P515

SCHREIBER, HU ;

GRABE, B .

SCHWARZ, JA .

[9] COMPENSATING EFFECTS IN ELECTROMIGRATION KINETICS [J].

SCHWARZ, JA ;

FELTON, LE .