SCANNING NEAR-FIELD OPTICAL MICROSCOPY

被引：234

作者：

HEINZELMANN, H ^{[1
]}

POHL, DW ^{[1
]}

机构：

[1] IBM CORP,RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1994年 / 59卷 / 02期

关键词：

D O I：

10.1007/BF00332200

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Scanning Near-field Optical Microscopy (SNOM) allows the investigation of optical properties on subwavelength scales. During the past few years, more and more attention has been given to this technique that shows enormous potential for imaging, sensing and modification at near-molecular resolution. This article describes the technique and reviews recent progress in the field.

引用

页码：89 / 101

页数：13

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