LIQUID-METAL SOURCES IN ION MICROSCOPY AND SECONDARY ION MASS-SPECTROMETRY

被引：0

作者：

MAIR, GLR ^{[1
]}

MULVEY, T ^{[1
]}

机构：

[1] UNIV ASTON,DEPT MATH & PHYS,BIRMINGHAM B4 7ET,W MIDLANDS,ENGLAND

来源：

SCANNING ELECTRON MICROSCOPY | 1985年

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：959 / 971

页数：13

共 50 条

[1] LIQUID-METAL SUBSTRATE FOR DYNAMIC SECONDARY ION MASS-SPECTROMETRY
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[6] CESIUM LIQUID-METAL ION-SOURCE FOR SECONDARY-ION MASS-SPECTROMETRY
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[8] SECONDARY ION MASS-SPECTROMETRY OF ORGANIC ADSORBATES ON CARBON PARTICLES AND LIQUID-METAL SURFACES
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[9] THE APPLICATION OF LIQUID-METAL ION SOURCES TO ION MICROPROBE SECONDARY ION MASS-SPECTROSCOPY
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