MICROHARDNESS OF HG1-XCDXTE AND HG1-XZNXTE

被引：15
作者：
FISSEL, A
SCHENK, M
机构：
[1] Humbolt-Universität Zu Berlin, Sektion Physik, Bereich Kristallographie, Berlin, DDR‐1040
来源：
CRYSTAL RESEARCH AND TECHNOLOGY | 1990年 / 25卷 / 01期
关键词：
D O I：
10.1002/crat.2170250117
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The microhardness of Hg1−xCdxTe and Hg1−xZnxTe has been measured on monocrystalline samples of Bridgman and THM crystals as a function of composition x by means of Vickers indentation measurements at room temperature. The curves show maxima of about 830 MPa at x ≈ 0.75 for Hg1−xCdxTe and of about 1700 MPa in the range 0.65 ≦ x ≦ 0.8 for Hg1−xZnxTe. The hardness‐relaxation behaviour has been measured on {111} samples in order to obtain the internal stress level and to investigate the stress‐relaxation behaviour. The theoretical hardening rate dH/d(x)0.5 was compared with experimental values. Copyright © 1990 WILEY‐VCH Verlag GmbH & Co. KGaA
引用
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页码：89 / 95
页数：7
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