MICROHARDNESS OF HG1-XCDXTE AND HG1-XZNXTE

被引：15

作者：

FISSEL, A

SCHENK, M

机构：

[1] Humbolt-Universität Zu Berlin, Sektion Physik, Bereich Kristallographie, Berlin, DDR‐1040

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1990年 / 25卷 / 01期

关键词：

D O I：

10.1002/crat.2170250117

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The microhardness of Hg1−xCdxTe and Hg1−xZnxTe has been measured on monocrystalline samples of Bridgman and THM crystals as a function of composition x by means of Vickers indentation measurements at room temperature. The curves show maxima of about 830 MPa at x ≈ 0.75 for Hg1−xCdxTe and of about 1700 MPa in the range 0.65 ≦ x ≦ 0.8 for Hg1−xZnxTe. The hardness‐relaxation behaviour has been measured on {111} samples in order to obtain the internal stress level and to investigate the stress‐relaxation behaviour. The theoretical hardening rate dH/d(x)0.5 was compared with experimental values. Copyright © 1990 WILEY‐VCH Verlag GmbH & Co. KGaA

引用

页码：89 / 95

页数：7

共 24 条

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