PRECISE QUANTIZED HALL RESISTANCE MEASUREMENTS IN GAAS/ALXGA1-XAS AND INXGA1-XAS/INP HETEROSTRUCTURES

被引：54
作者：
DELAHAYE, F
DOMINGUEZ, D
ALEXANDRE, F
ANDRE, JP
HIRTZ, JP
RAZEGHI, M
机构：
[1] CTR NATL ETUD TELECOMMUN,F-92220 BAGNEUX,FRANCE
[2] LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
[3] THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
来源：
METROLOGIA | 1986年 / 22卷 / 02期
关键词：
D O I：
10.1088/0026-1394/22/2/005
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
HALL EFFECT
引用
收藏
页码：103 / 110
页数：8
相关论文
共 17 条
[1]   HIGH-PRECISION MEASUREMENTS OF THE QUANTIZED HALL RESISTANCE AT THE PTB [J].
BLIEK, L ;
BRAUN, E ;
MELCHERT, F ;
WARNECKE, P ;
SCHLAPP, W ;
WEIMANN, G ;
PLOOG, K ;
EBERT, G ;
DORDA, GE .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) :304-305
[2]   TEMPERATURE-DEPENDENCE OF THE QUANTUM HALL RESISTANCE [J].
CAGE, ME ;
FIELD, BF ;
DZIUBA, RF ;
GIRVIN, SM ;
GOSSARD, AC ;
TSUI, DC .
PHYSICAL REVIEW B, 1984, 30 (04) :2286-2288
[3]   A TEST OF THE QUANTUM HALL-EFFECT AS A RESISTANCE STANDARD [J].
CAGE, ME ;
DZIUBA, RF ;
FIELD, BF .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) :301-303
[4]   PROGRESS IN RESISTANCE RATIO MEASUREMENTS USING A CRYOGENIC CURRENT COMPARATOR AT LCIE [J].
DELAHAYE, F ;
REYMANN, D .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) :316-319
[5]  
ELNEKAVE N, IEE C PUBLICATION, V152, P53
[6]   MEASUREMENT SYSTEM FOR QUANTUM HALL-EFFECT UTILIZING A JOSEPHSON POTENTIOMETER [J].
ENDO, T ;
MURAYAMA, Y ;
KOYANAGI, M ;
KINOSHITA, J ;
INAGAKI, K ;
YAMANOUCHI, C ;
YOSHIHIRO, K .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) :323-327
[7]   QUANTUM HALL EFFECT IN MODULATION DOPED IN0.53GA0.47AS-INP HETEROJUNCTIONS. [J].
GULDNER, Y. ;
HIRTZ, J.P. ;
VIEREN, J.P. ;
VOISIN, P. ;
VOOS, M. ;
RAZEGHI, M. .
1982, V 43 (N 16) :613-616
[8]   A MEASUREMENT SYSTEM FOR THE DETERMINATION OF H/E2 IN TERMS OF THE SL OHM AND THE MAINTAINED OHM AT THE NPL [J].
HARTLAND, A ;
DAVIES, GJ ;
WOOD, DR .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) :309-314
[9]  
RAZEGHI M, 1985, SEMICONDUCT SEMIMET, V22, P299
[10]   LOW-TEMPERATURE DIRECT-CURRENT COMPARATORS [J].
SULLIVAN, DB ;
DZIUBA, RF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (04) :517-519
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