THE MEASUREMENT OF SCATTERING LOSSES IN THIN DIELECTRIC FILMS

被引：2

作者：

ALDOURI, AAJ

HEAVENS, OS

机构：

来源：

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 1983年 / 388卷 / 1794期

关键词：

D O I：

10.1098/rspa.1983.0074

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：103 / 116

页数：14

共 9 条

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HEAVENS, OS .

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[4] EFFECT OF DEPOSITION RATE AND SUBSTRATE TEMPERATURE ON VACUUM ULTRAVIOLET REFLECTANCE OF MGF-OVERCOATED AND LIF-OVERCOATED ALUMINUM MIRRORS [J].

HUTCHESO.ET ;

HASS, G ;

COX, JT .

APPLIED OPTICS, 1972, 11 (10) :2245-&

[5] OPTICAL LOSSES OF EVAPORATION-DEPOSITED DIELECTRIC WAVEGUIDES [J].

KERSTEN, RT ;

MAHLEIN, HF ;

RAUSCHER, W .

THIN SOLID FILMS, 1975, 28 (02) :369-374

[6]

KUWABARA G, 1957, J PHYS SOC JAPAN, V9, P97

[7] EFFECT OF DEPOSITION RATE ON THIN FILMS OF CADMIUM SULPHIDE [J].

OLIVER, WR .

VACUUM, 1970, 20 (03) :113-&

[8] LIGHT WAVES IN THIN FILMS AND INTEGRATED OPTICS [J].

TIEN, PK .

APPLIED OPTICS, 1971, 10 (11) :2395-&

[9]

WENDLANT WW, 1966, REFLECTION SPECTROSC

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