VISUAL INSPECTION IN INDUSTRIAL MANUFACTURING

被引：15

作者：

KONIG, A

WINDIRSCH, P

GASTEIER, M

GLESNER, M

机构：

来源：

IEEE MICRO | 1995年 / 15卷 / 03期

关键词：

D O I：

10.1109/40.387679

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Visual quality control is a demanding task of increasing importance in industrial manufacturing. Both speed and flexibility are of paramount importance for viable and competitive inspection systems. We have developed a dedicated neural network architecture for anomaly detection that can easily be trained by a single presentation of examples and is amenable to massively parallel VISI implementation. We focus here on our ASIC and prototype system design effort for this network.

引用

页码：26 / 31

页数：6