MICROWAVE MEASUREMENT OF SURFACE-RESISTANCE BY THE PARALLEL-PLATE DIELECTRIC RESONATOR METHOD

被引：12
|
作者：
MOURACHKINE, AP
BAREL, ARF
机构：
[1] Department ELEC Faculty of Applied Science, Free University of Brussels
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1995年 / 43卷 / 03期
关键词：
D O I：
10.1109/22.372099
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Analysis and experimental results are presented for a parallel-plate dielectric resonator method to measure the surface resistance of conducting or superconducting plates. In the present paper, three main questions are considered in detail: the influence of the relative sizes of the conducting or superconducting plates on the measured value of the surface resistance R(s), the influence of the shape of the plates on the R(s) measurement, and how to interpret obtained results, Measurements were made at resonant frequencies of 14.1-14.5 GHz in a temperature range between 77 and 300 K.
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页码：544 / 551
页数：8
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