COMPUTING AVERAGE RUN LENGTHS FOR EXPONENTIAL CUSUM SCHEMES

被引：18
作者：
GAN, FF
CHOI, KP
机构：
来源：
JOURNAL OF QUALITY TECHNOLOGY | 1994年 / 26卷 / 02期
关键词：
AVERAGE RUN LENGTH; CUMULATIVE SUM CONTROL CHARTS; EXPONENTIAL DISTRIBUTION; POISSON DISTRIBUTION;
D O I：
10.1080/00224065.1994.11979513
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Exponentially distributed observations arise naturally in the context of monitoring the rate of occurrences of events like nonconforming items. Cumulative sum (CUSUM) control charts are known to be very sensitive in detecting small shifts in the mean. A program is presented for computing average run lengths for CUSUM control charts when observations are exponentially distributed.
引用
收藏
页码：134 / 143
页数：10
相关论文
共 8 条
  • [1] BROOK D, 1972, BIOMETRIKA, V59, P539
  • [2] Conte C.D.B. S. D., 2017, SOC INDUS APPL MATH
  • [3] AVERAGE RUN LENGTHS OF EXPONENTIALLY WEIGHTED MOVING AVERAGE CONTROL CHARTS[J]. CROWDER, SV. JOURNAL OF QUALITY TECHNOLOGY, 1987(03)
  • [4] DESIGN OF OPTIMAL EXPONENTIAL CUSUM CONTROL CHARTS[J]. GAN, FF. JOURNAL OF QUALITY TECHNOLOGY, 1994(02)
  • [5] GAN FF, 1992, STAT SINICA, V2, P297
  • [6] HAWKINS DM, 1992, COMMUNICATIONS STA B, V21, P1000
  • [7] CONTINUOUS INSPECTION SCHEMES[J]. PAGE, ES. BIOMETRIKA, 1954(1-2)
  • [8] AVERAGE RUN LENGTHS FOR CUSUM SCHEMES WHEN OBSERVATIONS ARE EXPONENTIALLY DISTRIBUTED[J]. VARDEMAN, S;RAY, DO. TECHNOMETRICS, 1985(02)
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