Comparison of parasitic scattering from window materials used for small-angle X-ray scattering: A better beryllium window

被引：15

作者：

Henderson, SJ ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,DIV BIOL,OAK RIDGE,TN 37831

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1995年 / 28卷

关键词：

D O I：

10.1107/S0021889895005784

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The parasitic scattering of several materials used as windows in small-angle scattering experiments, including IF-1 beryllium, Kapton, Mylar, mica and glass has been measured over the q range 0.05-2.0 nm(-1) with Cu K alpha radiation (q = 4 pi sin theta/lambda, 2 theta = scattering angle). Based on the criteria of high strength, high transmission and low parasitic scattering, the best material was found to be IF-1 beryllium.

引用

页码：820 / 826

页数：7

共 7 条

[1] THE 6-M POINT-FOCUSING SMALL-ANGLE X-RAY-SCATTERING CAMERA AT THE HIGH-INTENSITY X-RAY LABORATORY OF KYOTO-UNIVERSITY [J].