POTENTIAL OF CCDS FOR UV AND X-RAY PLASMA DIAGNOSTICS

被引：27
|
作者：
JANESICK, JR [1 ]
ELLIOTT, T [1 ]
MARSH, HH [1 ]
COLLINS, S [1 ]
MCCARTHY, JK [1 ]
BLOUKE, MM [1 ]
机构：
[1] TEKTRONIX INC,BEAVERTON,OR 97077
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1985年 / 56卷 / 05期
关键词：
D O I：
10.1063/1.1138176
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：796 / 801
页数：6
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