ARRAY VELOCIMETER IMAGING LASER SPECKLE PATTERN

被引:2
作者
CHEN, PF [1 ]
机构
[1] USA,INST RES,ENGINEER TOPOG LABS,FT BELVOIR,VA 22060
关键词
D O I
10.1109/TIM.1976.6312322
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:108 / 111
页数:4
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