RADIATION-DAMAGE DISTRIBUTIONS FOR 300 KEV ANTIMONY IONS IMPLANTED INTO SILICON

被引:0
作者
TATARKIEWICZ, J
KRYNICKI, J
GROTZSCHEL, R
PAPROCKI, K
机构
[1] INST CHEM & NUCL TECHNOL,PL-03195 WARSAW,POLAND
[2] ZENT INST KERNFORSCH ROSSENDORF,DDR-8051 DRESDEN,GER DEM REP
[3] MARIE CURIE SKLODOWSKA UNIV,INST PHYS,PL-20031 LUBLIN,POLAND
关键词
D O I
10.1016/0375-9601(85)90245-2
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:48 / 50
页数:3
相关论文
共 7 条
  • [1] BRICE DK, 1975, ION IMPLANTATION RAN, V1
  • [2] EXPERIMENTAL SIMULATION ON BEAM HEATING EFFECTS IN ION-IMPLANTATION TECHNIQUES
    FURUKAWA, S
    INOUE, O
    ISHIWARA, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1973, 12 (07) : 1075 - 1076
  • [3] GIBBONS JF, 1975, PROJECTED RANGE STAT
  • [4] INVESTIGATIONS OF RADIATION-DAMAGE PRODUCTION IN ION-IMPLANTED SILICON
    GLASER, E
    GOTZ, G
    SOBOLEV, N
    WESCH, W
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 69 (02): : 603 - 614
  • [5] DETERMINATION OF THE RADIATION-DAMAGE IN ARSENIC-IMPLANTED SILICON BY PROFILING THE OXIDE-GROWTH RATE
    KISIELEWICZ, M
    WAGNER, C
    [J]. THIN SOLID FILMS, 1981, 85 (01) : 1 - 6
  • [6] TATARKIEWICZ J, 1983, P C PHYS POLISH ACAD, V6, P352
  • [7] Winterbon K.B., 1975, ION IMPLANTATION RAN, V2